The microscope revolution that’s sweeping through materials science
Technological advances are transforming what researchers can study at the atomic scale.
Using an ultra-sensitive detector that the researchers had created and a special method for reconstructing the data, they resolved features in MoS2 down to 0.39 angstroms, two and a half times better than a conventional electron microscope would achieve.
The advanced transmission electron microscopes (TEMs) machines promise to give scientists the ability to see details previously out of reach.


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