Archive for May 2015

Mittaus ja testaus 2015 visit

Some notes from Mittaus ja Testaus 2015 fair visit I made today: Mixed signal oscilloscopes were on display from all major manufacturers. Some had oscilloscope, logic analyzer and RF spectrum in same box, all data shown on same time scale and long history buffers. Some scopes had high bandwidth and hardware assisted FFT for spectrum

Mittaus ja testaus 2015

Mittaus ja Testaus (measuring and testing) fair will be held today and tomorrow (27.–28.5.2015) in AEL at Malminkartano Helsinki. The event is intended for automation and electronics industry, electric power, computer and telecommunication equipment for measurement, testing and maintenance professionals. There will be lecture related to technology to generate electricity from sunlight on both days.